The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2010

Filed:

Jul. 13, 2005
Applicants:

Greg L. Archer, Rochester, NY (US);

Eric J. Meisenzahl, Ontario, NY (US);

David N. Nichols, Fairport, NY (US);

Shen Wang, Webster, NY (US);

Inventors:

Greg L. Archer, Rochester, NY (US);

Eric J. Meisenzahl, Ontario, NY (US);

David N. Nichols, Fairport, NY (US);

Shen Wang, Webster, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting and removing noise from an image, the method includes the steps of applying a frequency transform to the image for obtaining a magnitude image; applying a threshold value to values of the magnitude image for obtaining threshold values; setting one or more threshold values to a predetermined value; and reconstructing the image from the magnitude image having the predetermined values for removing noise from the image.


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