The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Apr. 06, 2006
Naoki Kimura, Sakai, JP;
Toru Kobayashi, Ibaraki, JP;
Norio Ishikawa, Osaka, JP;
Konica Minolta Sensing, Inc., Sakai-shi, JP;
Abstract
A support apparatus for optical characteristic measurement includes a measurement data inputter configured to input measurement data obtained by an optical characteristic measuring instrument, an image inputter configured to input an image of a measurement object, a measurement table in which the measurement data and the image of the measurement object corresponding to the measurement data are recorded, and a measurement data manager configured to record the measurement data inputted by the measurement data inputter in the measurement table so as to be associated with the image of the measurement object every time an optical characteristic of the measurement object is measured.