The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Sep. 22, 2008
Tomohiro Fukamizu, Sakai, JP;
Yoshiyuki Nagashima, Sakai, JP;
Katsutoshi Tsurutani, Osaka, JP;
Shinji Shimizu, Sakai, JP;
Tomohiro Fukamizu, Sakai, JP;
Yoshiyuki Nagashima, Sakai, JP;
Katsutoshi Tsurutani, Osaka, JP;
Shinji Shimizu, Sakai, JP;
Konica Minolta Sensing, Inc., Osaka, JP;
Abstract
An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured.