The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

May. 31, 2006
Applicant:

Bernd Schulz, Radebeul, DE;

Inventor:

Bernd Schulz, Radebeul, DE;

Assignee:

GlobalFoundries, Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a technique for obtaining overlay error and PPE error information from a single measurement structure. This is accomplished by forming periodic sub-structures in at least two different device layers in a single measurement structure, wherein at least one segmented and one non-segmented portion is provided in the two different device layers.


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