The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Oct. 05, 2005
Rafael Ballabriga, Geneva, CH;
Michael Campbell, Geneva, CH;
Christer Frojdh, Sundsvall, SE;
Henricus M. Heijne, Meyrin, CH;
Xavier Llopart, Sergy, FR;
Hans-erik Nilsson, Sundsvall, SE;
Lukas Tlustos, Geneva, CH;
Rafael Ballabriga, Geneva, CH;
Michael Campbell, Geneva, CH;
Christer Frojdh, Sundsvall, SE;
Henricus M. Heijne, Meyrin, CH;
Xavier Llopart, Sergy, FR;
Hans-Erik Nilsson, Sundsvall, SE;
Lukas Tlustos, Geneva, CH;
Organisation Europeenne pour la Recherche Nucleaire, Geneva, CH;
Abstract
A method for determining a particle impact on a sensor device comprising M sensing areas, each impact causing a variation of at least one physical magnitude of several sensing portions, said method comprising the steps of: determining an impact center sensing area, where the variation of the at least one physical magnitude is substantially maximal, allocating a result of a sum of the physical magnitude variations of a first set of N sensing areas, said set including the impact center area and other sensing areas neighboring said impact center sensing area, where N is at least 2 and is strict less than M.