The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Jan. 25, 2007
Christian Rembe, Waldbronn, DE;
Christian Rembe, Waldbronn, DE;
Polytec GmbH, Waldbronn, DE;
Abstract
A measuring device for the optic measuring of an objectis provided, in particular for measuring a motion of the object. The device includes an interferometerwith a measuring beam exit, a reflection beam entry, an interfering beam exit, and a light sourcefor creating a light beam, an optic detector, which is arranged at the interfering beam exitof the interferometersuch that a light beam exiting the interfering beam exitimpinges the detector and a signal processing unitconnected to the detectorbeing embodied such that they can measure measuring signals of the detector. The interferometer () is provided with a switched beam entry () and is embodied such that dependent on a switching signal connected to a switched beam entry () a light beam exits the measuring beam exit () essentially with a predetermined light intensity and at a predetermined angle, and that the signal processing unit () is provided with a switched beam exit, which is connected to the switched beam entry () of the interferometer, with the signal processing unit () controlling the interferometer such that a light beam exits the measuring beam exit () only during the measuring of measuring signals essentially with a predetermined light intensity and at a predetermined angle.