The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Mar. 16, 2007
Applicant:

Masatoshi Tagaki, Suwa, JP;

Inventor:

Masatoshi Tagaki, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/788 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device including: a well layer that is formed on a semiconductor substrate; a first impurity diffusion layer that is formed on the well layer; a floating gate that is formed on the well layer in one region isolated from the first impurity diffusion layer, with a gate insulating film therebetween, and that is drawn over the first impurity diffusion layer and over the well layer in other region isolated from the first impurity diffusion layer, respectively; a source or drain layer that is formed on the well layer in such a manner that the source or drain layer sandwiches the floating gate disposed on the gate insulation film with another source or drain layer and in isolation from the first impurity diffusion layer; and a second impurity diffusion layer that is formed on the well layer adjacently to the other region, the well layer being of a first conductivity type while the source or drain layer, the first impurity diffusion layer and the second impurity diffusion layer being each of a second conductivity type.


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