The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Aug. 14, 2008
Applicant:

Bruce L. Becker, Madison, WI (US);

Inventor:

Bruce L. Becker, Madison, WI (US);

Assignee:

Bruker AXS, Inc., Madison, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); H05G 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an X-ray diffraction apparatus, a sample holder has a sample mounted on a pin extending a known distance from a cap that mates with a magnetized base on a goniometer. The sample is mechanically positioned in the center of an X-ray beam by a first movable arm which is located in a precise position relative to the goniometer base by a positioning mechanism and a mechanism that forces the pin into engagement with the first arm. The sample has a known height on the pin with respect to the cap and therefore, the sample can repeatedly be located in the center of the X-ray beam without the use of complex centering arrangements. In order to allow the sample holder to be removed from the goniometer base, a linkage is provided that releases the pin from the first arm.


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