The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Nov. 30, 2006
Applicants:

Huilong Zhu, Poughkeepsie, NY (US);

Yue Tan, Fishkill, NY (US);

Inventors:

Huilong Zhu, Poughkeepsie, NY (US);

Yue Tan, Fishkill, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor structure and its method of fabrication include multiple finFETs with different vertical dimensions for the semiconductor fins. An implant species is implanted in a bottom portion of selected semiconductor fins on which reduced vertical dimension is desired. The bottom portion of the selected semiconductor fins with implant species is etched selective to the semiconductor material without the implanted species, i.e., the semiconductor material in the top portion of the semiconductor fin and other semiconductor fins without the implanted species. FinFETs with the full vertical dimension fins and a high on-current and finFETs with reduced vertical dimension fins with a low on-current thus results on the same semiconductor substrate. By adjusting the depth of the implant species, the vertical dimension of the semiconductor fins may be adjusted in selected finFETs.


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