The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2010

Filed:

Dec. 28, 2006
Applicants:

Jun Wan, Sunnyvale, CA (US);

Jeffrey W. Lutze, San Jose, CA (US);

Jian Chen, San Jose, CA (US);

Yan LI, Milpitas, CA (US);

Alex Mak, Los Altos Hills, CA (US);

Inventors:

Jun Wan, Sunnyvale, CA (US);

Jeffrey W. Lutze, San Jose, CA (US);

Jian Chen, San Jose, CA (US);

Yan Li, Milpitas, CA (US);

Alex Mak, Los Altos Hills, CA (US);

Assignee:

SanDisk Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory system, comprising an array of storage elements divided into logical blocks and pages within said logical blocks and a managing circuit is provided. The managing circuit is in communication with said array of storage elements and performs programming and reading operations. The programming operations include programming a plurality of multi-state storage data. The reading operations include defining an retention margin between adjacent data thresholds, determining whether bits are present in a portion of the data retention margin, and if the number of bits in the portion of retention margin exceeds a threshold, generating an error.


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