The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2010

Filed:

Apr. 17, 2003
Applicants:

Yoshikazu Nakayama, Saitama, JP;

Masato Haruta, Saitama, JP;

Inventors:

Yoshikazu Nakayama, Saitama, JP;

Masato Haruta, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The error of a measurement system can be corrected even if the frequency of an input signal of a device under test is different from that of the output signal. A signal output acquiring section acquires the power of the input signal by a power meter not shown in the drawing. Thus, errors due to frequency tracking can be separated depending on the direction in a signal flow graph. Since a receiver measures the parameter concerning the received signal when a signal source is directly connected to a receiver, the measurement system error factor of the receiver can be acquired. The parameter of a device under test can be measured while the error is corrected when the results of measurement, concerning the device under test of receivers are combined.


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