The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Dec. 21, 2006
Applicants:

Kayhan Kucukcakar, Sunnyvale, CA (US);

Ali Dasdan, San Jose, CA (US);

Halim Damerdji, Los Altos, CA (US);

Inventors:

Kayhan Kucukcakar, Sunnyvale, CA (US);

Ali Dasdan, San Jose, CA (US);

Halim Damerdji, Los Altos, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 17/10 (2006.01); G06F 19/00 (2006.01); G01R 27/08 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system that determines the performance of an integrated circuit (IC). During operation, the system receives probability distributions for parameters for the IC. Next, the system generates samples of the IC, wherein generating a given sample involves using the probability distribution to assign values to the parameters for components within the IC. The system then calculates output performance metrics for the samples based on the assigned values of the parameters, and uses the calculated output performance metrics to generate a distribution of output performance metrics for the samples.


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