The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Feb. 28, 2007
Applicants:
Phillip D. Burlison, Morgan Hill, CA (US);
John K. Frediani, Corralitos, CA (US);
Inventors:
Phillip D. Burlison, Morgan Hill, CA (US);
John K. Frediani, Corralitos, CA (US);
Assignee:
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for locating a defect in a scan chain by recording the last bit position in a serial data stream at which a certain data state is observed during a test comprising a plurality of patterns.
Burlison, Phillip. (2010). Apparatus for locating a defect in a scan chain while testing digital logic (U.S. Patent No. 7650547). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7650547
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile