The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Jun. 15, 2004
Applicants:

Chiou-feng Chen, Santa Clara, CA (US);

Der-tsyr Fan, Hsinchu, TW;

Prateep Tuntasood, Santa Clara, CA (US);

Inventors:

Chiou-Feng Chen, Santa Clara, CA (US);

Der-Tsyr Fan, Hsinchu, TW;

Prateep Tuntasood, Santa Clara, CA (US);

Assignee:

Silicon Storage Technology, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

NAND flash memory cell array having control gates and charge storage gates stacked in pairs arranged in rows between a bit line diffusion and a common source diffusion, with select gates on both sides of each of the pairs of stacked gates. The gates in each stacked pair are self-aligned with each other, and the charge storage gates are either a nitride or a combination of nitride and oxide. Programming is done by hot electron injection from silicon substrate to the charge storage gates to build up a negative charge in the charge storage gates. Erasing is done by channel tunneling from the charge storage gates to the silicon substrate or by hot hole injection from the silicon substrate to the charge storage gates. The array is biased so that all of the memory cells can be erased simultaneously, while programming is bit selectable.


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