The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Apr. 11, 2008
Kun-wei Lin, Tainan County, TW;
Yi-hsuan Chiang, Pingtung County, TW;
Lung-yu Cheng, Tainan, TW;
Yu-hsiu Chang, Changhua County, TW;
Kun-Wei Lin, Tainan County, TW;
Yi-Hsuan Chiang, Pingtung County, TW;
Lung-Yu Cheng, Tainan, TW;
Yu-Hsiu Chang, Changhua County, TW;
Industrial Technology Research Institute, Hsin-Chu, TW;
Abstract
A reflectance measuring apparatus is provided in the present invention. In addition to measuring the intensity of light directly reflected from a sample, the apparatus is further capable of collecting large-angle reflected light scattered from the sample through a reflecting cover disposed over the sample and measuring the intensity thereof. In one embodiment, the reflecting cover has a parabolic surface for modulating the large-angle reflected light to become parallel light projecting onto a photo-detector. In another embodiment, the reflecting cover has an elliptic surface for modulating the large-angle scattered light to focus on the photo-detector.