The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Nov. 23, 2004
Applicants:

David L. Linam, Fort Collins, CO (US);

Jeffrey R. Rearick, Fort Collins, CO (US);

Guy Harlan Humphrey, Fort Collins, CO (US);

Inventors:

David L. Linam, Fort Collins, CO (US);

Jeffrey R. Rearick, Fort Collins, CO (US);

Guy Harlan Humphrey, Fort Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for testing an integrated circuit interconnect comprises an IC having circuitry embedded in the IC capable of providing a pseudo time domain reflectometry test by launching a test transition onto the interconnect and capturing a reflection of the test transition.


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