The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Apr. 02, 2001
Applicants:

Hisae Shibuya, Yokohama, JP;

Tatsuo Horiuchi, Chigasaki, JP;

Yoshinao Nozaki, Higashimurayama, JP;

Yoshio Yoshiwara, Mobara, JP;

Inventors:

Hisae Shibuya, Yokohama, JP;

Tatsuo Horiuchi, Chigasaki, JP;

Yoshinao Nozaki, Higashimurayama, JP;

Yoshio Yoshiwara, Mobara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/02 (2006.01); H04N 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for evaluating a color picture tube includes displaying on a display surface of a color picture tube a measurement pattern including a plurality of first patterns arranged at different positions relative to fluophor dots of said color picture tube and a plurality of second patterns near said first patterns and sufficiently large relative to said fluophor dots. A first image is obtained using an imaging element to image said displayed measurement pattern. A second image is obtained using said imaging element to image while controlling light intake to allow brightness components of no more than about 1% of maximum luminance from said first image to be separated from noise and imaged. A third image is created by combining said first image and said second image while adjusting scales according to a light intake ratio. From said third image, display center positions of said plurality of first patterns is calculated using said second pattern positions. Discrete fluophor emission intensity distributions is calculated for each of said plurality of first patterns. An electron beam intensity distribution is obtained by matching display center positions of said plurality of first patterns and combining said plurality of first patterns.


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