The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Sep. 22, 2008
Applicants:

Martin Miller, Avusy, CH;

Yaron Habot, Teaneck, NJ (US);

Joseph Schachner, Suffern, NY (US);

Michael Schnecker, Doylestown, PA (US);

Peter J. Pupalaikis, Ramsey, NJ (US);

Inventors:

Martin Miller, Avusy, CH;

Yaron Habot, Teaneck, NJ (US);

Joseph Schachner, Suffern, NY (US);

Michael Schnecker, Doylestown, PA (US);

Peter J. Pupalaikis, Ramsey, NJ (US);

Assignee:

LeCroy Corporation, Chestnut Ridge, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/04 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for processing a data signal is provided. An acquisition unit of a test instrument acquires a data signal for a predetermined time. The data signal is stored in a memory of the test instrument and a clock recovery unit recovers a clock signal from the stored data signal. The stored data signal is sliced by a processor into a plurality of data segments of a predetermined length in accordance with the recovered clock signal.


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