The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Mar. 03, 2006
Applicant:

Masayuki Kawabata, Tokyo, JP;

Inventor:

Masayuki Kawabata, Tokyo, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A waveform input circuit, waveform observation unit and semiconductor test apparatus allow to faithfully observe waveform of a device under test with high output impedance and low load driving capability. A waveform input circuit includes a high input impedance terminating resistance which receives an input signal from a transmission line, a relay which selects a terminating resistance, an input buffer which is connected when the high input impedance terminating resistance is selected. A reference potential switch is further provided to select a reference potential of the transmission line where one reference potential is controlled to be in phase with the input signal by an input buffer which is connected when the high input impedance terminating resistance is selected.


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