The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Jul. 06, 2007
Peter Schwarz, Koenigsdorf, DE;
Konrad Lex, Koenigsdorf, DE;
Peter Schwarz, Koenigsdorf, DE;
Konrad Lex, Koenigsdorf, DE;
BYK-Gardner GmbH, , DE;
Abstract
Disclosed is an apparatus for determining surface properties, comprising at least a first radiation device which emits radiation onto a surface to be analysed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a second radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation. According to the disclosure, the first radiation detector device is offset by a first predefined angle βwith respect to the direction of the radiation reflected by the surface, and the further radiation detector device is offset by further predefined angle γwith respect to the direction of the radiation reflected by the surface, and the ratio between the value of the further predefined angle γand the value of the first predefined angle βis at least 1.5:1.