The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7633309 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 15, 2009

Filed:

Dec. 20, 2007
Applicants:

Yasunori Kumagai, Nirasaki, JP;

Ka Toh, Nirasaki, JP;

Inventors:

Yasunori Kumagai, Nirasaki, JP;

Ka Toh, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection apparatus includes a fritting circuit applying a voltage between a probe pair composed of probes in pairs in contact with a substrate to cause a fritting phenomenon to establish electrical conduction between the probes and the substrate; and a switching circuit electrically connecting the probe pair and the flitting circuit and capable of freely switching between polarities of a voltage applied between the probe pair. Voltage is applied twice between the probe pair in contact with the substrate to thereby perform fritting twice. In the two times of fritting, the polarities of the voltage applied between the probe pair are changed.


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Kumagai, Yasunori. (2009). Inspection method, inspection apparatus and computer-readable storage medium storing program for inspecting an electrical property of an object (U.S. Patent No. 7633309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7633309

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