The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Sep. 27, 2006
Applicants:

Ae-yong Chung, Cheonan-si, KR;

Eun-seok Lee, Asan-si, KR;

Ki-sang Kang, Yongin-si, KR;

Kyeong-seon Shin, Yongin-si, KR;

Inventors:

Ae-Yong Chung, Cheonan-si, KR;

Eun-Seok Lee, Asan-si, KR;

Ki-Sang Kang, Yongin-si, KR;

Kyeong-Seon Shin, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.


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