The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2009
Filed:
Sep. 26, 2002
Applicants:
Hirohito Yamakawa, Saitama, JP;
Eriko Suzuki, Saitama, JP;
Kiyoko Miyatake, Saitama, JP;
Katsuyuki Hayakawa, Saitama, JP;
Inventors:
Hirohito Yamakawa, Saitama, JP;
Eriko Suzuki, Saitama, JP;
Kiyoko Miyatake, Saitama, JP;
Katsuyuki Hayakawa, Saitama, JP;
Assignee:
Nisshin Seifun Group Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of testing the presence/absence of wheat in a food by performing PCR with the use of primers which have been designed on the basis of data obtained from a part of a gene of wheat. This method is highly useful in detecting a trace component contained in a food or identifying a harmful allergen of wheat.