The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2009

Filed:

Aug. 18, 2008
Applicants:

Peter A. Reichert, Boston, MA (US);

Govindarajan T. Srinivasan, Portsmouth, NH (US);

Joseph F. Wrinn, Winchester, MA (US);

Michael W. Hamblin, Stow, MA (US);

Inventors:

Peter A. Reichert, Boston, MA (US);

Govindarajan T. Srinivasan, Portsmouth, NH (US);

Joseph F. Wrinn, Winchester, MA (US);

Michael W. Hamblin, Stow, MA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a system for linearizing image data corresponding to one or more objects and output by an imaging device is provided. The system includes a processor configured for: receiving the image data from the imaging device; and producing a generally linear relationship between the image data and a thickness of the one or more objects. The generally linear relationship is produced according to the equation I is an intensity of the image data, Iis an intensity of energy produced by the imaging device for outputting the image data, μ is an attenuation coefficient of the one or more objects, and l is the thickness of the one or more objects.


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