The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Mar. 11, 2008
Ho Pui Ho, Kowloon, CN;
Chi Lok Wong, Fanling, CN;
Shu Yuen Wu, Wah Fu, CN;
Wing Cheung Law, Kwai Chung, CN;
Chinlon Lin, Shatin, CN;
Siu Kai Kong, Kowloon, CN;
Ho Pui Ho, Kowloon, CN;
Chi Lok Wong, Fanling, CN;
Shu Yuen Wu, Wah Fu, CN;
Wing Cheung Law, Kwai Chung, CN;
Chinlon Lin, Shatin, CN;
Siu Kai Kong, Kowloon, CN;
The Chinese University of Hong Kong, Hong Kong, CN;
Abstract
Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.