The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2009
Filed:
Jul. 24, 2008
Applicants:
Gwang-young Kim, Gyeonggi-do, KR;
Jong-youb Kim, Seoul, KR;
Boung-lyoul Jung, Gyeonggi-do, KR;
Joon-su Ji, Gyeonggi-do, KR;
Inventors:
Gwang-Young Kim, Gyeonggi-do, KR;
Jong-Youb Kim, Seoul, KR;
Boung-Lyoul Jung, Gyeonggi-do, KR;
Joon-Su Ji, Gyeonggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.