The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Dec. 13, 2005
Applicants:

Zheng (Jeff) Chen, Allentown, PA (US);

Phillip Johnson, Hellertown, PA (US);

Fulong Zhang, Allentown, PA (US);

Inventors:

Zheng (Jeff) Chen, Allentown, PA (US);

Phillip Johnson, Hellertown, PA (US);

Fulong Zhang, Allentown, PA (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed herein to provide improved jitter tolerant delay-locked loop circuitry. For example, in accordance with an embodiment of the present invention, an integrated circuit includes a plurality of delay cells each having a plurality of programmable delay taps. Each delay cell is adapted to provide a delayed clock signal delayed by a selected number of the delay taps. A phase detector is adapted to compare a first clock signal with a selected one of the delayed clock signals to obtain a comparison result and provide a plurality of control signals in response to the comparison result. An arithmetic logic unit (ALU) is adapted to vary the selected number of delay taps in response to the control signals provided by the phase detector.


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