The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Aug. 29, 2006
Chi-fai Cheung, Hung Hom, HK;
Huifen LI, Hung Hom, HK;
Wing-bun Lee, Hung Hom, HK;
Suet to, Hong Hom, HK;
Lingbao Kong, Hung Hom, HK;
Chi-Fai Cheung, Hung Hom, HK;
Huifen Li, Hung Hom, HK;
Wing-Bun Lee, Hung Hom, HK;
Suet To, Hong Hom, HK;
Lingbao Kong, Hung Hom, HK;
The Hong Kong Polytechnic University, Hong Kong SAR, CN;
Abstract
Ultra-precision freeform surfaces are important to the development of complex and micro-optical-electro-mechanical devices used in many photonics and telecommunication products such as F-theta lenses for laser printers. These surfaces are complex and large scale surface topologies with shapes that generally possesses no rotational symmetry. Due to the geometrical complexities of these ultra-precision freeform surfaces, it is difficult to characterize the form accuracy and surface quality of freeform optical surfaces. The method of this invention is based on feature-point pre-fixture, and iterative precision alignment algorithm, which can provide sufficient capability of form characterization for ultra-precision freeform surfaces with form accuracy down to below sub-micrometer range