The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Dec. 28, 2006
Jun Wan, Sunnyvale, CA (US);
Jeffrey W. Lutze, San Jose, CA (US);
Jian Chen, San Jose, CA (US);
Yan LI, Milpitas, CA (US);
Alex Mak, Los Altos Hills, CA (US);
Jun Wan, Sunnyvale, CA (US);
Jeffrey W. Lutze, San Jose, CA (US);
Jian Chen, San Jose, CA (US);
Yan Li, Milpitas, CA (US);
Alex Mak, Los Altos Hills, CA (US);
SanDisk Corporation, Milpitas, CA (US);
Abstract
Data verification in a memory device using a portion of a data retention margin is provided. A bit count is read from the region to determine whether errors will result in the memory. A read in one or more retention margin portions is performed after the normal program verify sequence and if the number of bits in these regions is more than a pre-set the memory will fail verify status. A method of verifying data in a memory device includes the steps of: defining an retention margin between adjacent data thresholds; programming the memory device with data; determining whether bits are present in the data retention margin; and if the number of bits in the retention margin exceeds a threshold, generating an error.