The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7609803 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 27, 2009

Filed:

Oct. 02, 2008
Applicants:

Yosuke Okamoto, Kanagawa-ken, JP;

Naruomi Akino, Tochigi-ken, JP;

Inventors:

Yosuke Okamoto, Kanagawa-ken, JP;

Naruomi Akino, Tochigi-ken, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.


Find Patent Forward Citations

Okamoto, Yosuke. (2009). Method for estimating scattered ray intensity in x-ray ct and x-ray ct apparatus (U.S. Patent No. 7609803). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7609803

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