The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Apr. 24, 2008
Applicants:
Pierre Bertrand, Montbelliard, FR;
Christian Coddet, Giromagny, FR;
Sophie Costil, Offemont, FR;
Frederic Leman, Montrouge, FR;
Sebastien Lukat, Mulhouse, FR;
Inventors:
Pierre Bertrand, Montbelliard, FR;
Christian Coddet, Giromagny, FR;
Sophie Costil, Offemont, FR;
Frederic Leman, Montrouge, FR;
Sebastien Lukat, Mulhouse, FR;
Assignee:
SNECMA, Paris, FR;
Primary Examiner:
Int. Cl.
CPC ...
H01S 4/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of making a device for measuring deformation includes a step of depositing a silicon adhesion underlayer on a silicon carbide surface by chemical vapor spraying, and a step of depositing a coating on the silicon adhesion underlayer by atmospheric thermal spraying.