The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Apr. 19, 2006
Applicants:

Byung-yong Choi, Suwon-si, KR;

Tae-yong Kim, Suwon-si, KR;

Eun-suk Cho, Suwon-si, KR;

Suk-kang Sung, Seongnam-si, KR;

Hye-jin Cho, Seongnam-si, KR;

Dong-gun Park, Seongnam-si, KR;

Choong-ho Lee, Seongnam-si, KR;

Inventors:

Byung-yong Choi, Suwon-si, KR;

Tae-yong Kim, Suwon-si, KR;

Eun-suk Cho, Suwon-si, KR;

Suk-kang Sung, Seongnam-si, KR;

Hye-jin Cho, Seongnam-si, KR;

Dong-gun Park, Seongnam-si, KR;

Choong-ho Lee, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/792 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a non-volatile memory device allowing multi-bit and/or multi-level operations, and methods of operating and fabricating the same, the non-volatile memory device comprises, in one embodiment: a semiconductor substrate, doped with impurities of a first conductivity type, which has one or more fins defined by at least two separate trenches formed in the substrate, the fins extending along the substrate in a first direction; pairs of gate electrodes formed as spacers at sidewalls of the fins, wherein the gate electrodes are insulated from the semiconductor substrate including the fins and extend parallel to the fins; storage nodes between the gate electrodes and the fins, and insulated from the gate electrodes and the semiconductor substrate; source regions and drain regions, which are doped with impurities of a second conductivity type, and are separately formed at least at surface portions of the fins and extend across the first direction of the fins; and channel regions corresponding to the respective gate electrodes, formed at least at surface regions of the sidewalls of the fins between the source and the drain regions.


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