The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7601645 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 13, 2009

Filed:

Oct. 15, 2007
Applicants:

Doug H. Lee, Poughquag, NY (US);

Andreas Knorr, Wappingers Falls, NY (US);

Inventors:

Doug H. Lee, Poughquag, NY (US);

Andreas Knorr, Wappingers Falls, NY (US);

Assignee:

Globalfoundries Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/461 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for fabricating devices having small feature sizes are provided. In an exemplary embodiment, a method comprises forming a patterned first mask layer overlying a subject material layer and isotropically etching the patterned first mask layer. A second masking layer is deposited overlying the patterned first mask layer and the isotropically-etched patterned first mask layer is exposed. The isotropically-etched patterned first mask layer is removed and the subject material layer is etched to form a feature therein.


Find Patent Forward Citations

Lee, Doug. (2009). Methods for fabricating device features having small dimensions (U.S. Patent No. 7601645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7601645

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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