The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Jun. 07, 2006
Applicants:
Richard K. Eguchi, Austin, TX (US);
Larry J. Grieve, Austin, TX (US);
Thomas Jew, Austin, TX (US);
Inventors:
Assignee:
Freescale Semiconductor, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Integrated testing components and testing algorithm on a non-volatile memory module provide faster Vt (threshold voltage) distributions during the module verification process. The memory module includes address and voltage scanning components and a bit counter for storing the number of 0's or 1's for a specified voltage. As the range of addresses are scanned across a range of voltages, the instances of the count value being counted is accumulated by the bit counter. Automated Tester Equipment (ATE) reads the accumulated count value for each tested voltage.