The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Nov. 07, 2007
Rex W. Pirkle, Denison, TX (US);
Sean M. Malolepszy, Sherman, TX (US);
Michael W. Perry, Sherman, TX (US);
George Reeves, Sherman, TX (US);
Rex W. Pirkle, Denison, TX (US);
Sean M. Malolepszy, Sherman, TX (US);
Michael W. Perry, Sherman, TX (US);
George Reeves, Sherman, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Embodiments of the present disclosure provide a routing engine, a method of routing a test probe and a testing system employing the router or the method. In one embodiment, the routing engine is for use with a test unit having at least one test probe and includes an analysis unit configured to analyze alternative test probe routing sequences that employ representative circuit chips of a semiconductor wafer to be tested by the test unit. The routing engine also includes a selection unit configured to select at least one of the test probe routing sequences as a test probe path for testing the semiconductor wafer based on a total cost of travel for the test probe path.