The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Dec. 06, 2005
Shinichi Nakamura, Tokyo, JP;
Shinichi Nakamura, Tokyo, JP;
Unitechno Inc., Tokyo, JP;
Abstract
It is an object of the present invention to provide a double-ended contact probe that can be improved in productivity to ensure that the contact members are stably movable with respect to each other, and electrically connected to each other. The double-ended contact probe comprises first and second conductive membersandconstructed as electrical contact portions, an elastic membermade in the form of a hollow shape, the elastic memberintervening between the first and second conductive membersandto urge the first and second conductive membersandin respective directions opposite to each other when one of the first and second conductive membersandapproaches within a predetermined distance of the other of the first and second conductive membersand, and a third conductive memberaccommodated in the elastic member, and disposed on a central axis, wherein the elastic memberhas a pair of end portions for retaining the first and second conductive membersand, and an intermediate portion for retaining the third conductive memberto allow the third conductive memberto be pointed in a specific direction, and to be slidably movable with respect to each of the first and second conductive membersand