The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2009

Filed:

Dec. 30, 2005
Applicants:

Brian J. Bosy, Framingham, MA (US);

Craig A. Dipalo, Acton, MA (US);

Seth E. Mann, Reading, MA (US);

David W. Lewinnek, Somerville, MA (US);

Michael A. Chiu, Somerville, MA (US);

Inventors:

Brian J. Bosy, Framingham, MA (US);

Craig A. DiPalo, Acton, MA (US);

Seth E. Mann, Reading, MA (US);

David W. Lewinnek, Somerville, MA (US);

Michael A. Chiu, Somerville, MA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.


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