The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Sep. 18, 2008
Deming Shu, Darien, IL (US);
Hanfei Yan, Moriches, NY (US);
Jorg M. Maser, Oak Park, IL (US);
UChicago Argonne, LLC, Chicago, IL (US);
Abstract
A multidimensional alignment apparatus is provided for multidimensional aligning of two linear multilayer Laue lenses (MLLs) for two-dimensional hard X-ray focusing. The multidimensional alignment apparatus precisely aligns and ensures stability of two linear MLLs performing hard x-ray focusing. The multidimensional alignment apparatus includes a base, a lower stages group controlling a first upstream MLL, an upper stages group positioned over the lower stages group controlling a second downstream MLL and an upper stage support attached to the base. The lower stages group provides five degrees of freedom precision positioning adjustment for the first upstream MLL. The second downstream MLL is mounted on the upper stages group with three degrees of freedom adjustment capability.