The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Sep. 17, 2007
Sotomitsu Hara, Tsukuba, JP;
Yutaka Tsuchida, Tsukuba, JP;
Yoshikazu Arai, Sendai, JP;
Yasushi Ishii, Mitaka, JP;
Makoto Abe, Tsukuba, JP;
Yasushi Ueshima, Tsukuba, JP;
Sotomitsu Hara, Tsukuba, JP;
Yutaka Tsuchida, Tsukuba, JP;
Yoshikazu Arai, Sendai, JP;
Yasushi Ishii, Mitaka, JP;
Makoto Abe, Tsukuba, JP;
Yasushi Ueshima, Tsukuba, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A shape measurement method for measuring a shape of an object to be measured, which has a substantially rotating symmetric shape, includes: placing an aperture having an opening larger than an outer shape of the object to be measured and the object to be measured on an optical axis; taking an image generated by light projected to the object to be measured, by using an image pickup unit; and calculating one cross-sectional shape of the object to be measured based on a light intensity distribution of the image taken by the image pickup unit.