The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Dec. 23, 2005
Toshiyuki Yokosuka, Hitachi, JP;
Kinya Kobayashi, Hitachi, JP;
Kiyomi Yoshinari, Hitachi, JP;
Atsushi Otake, Hitachiohta, JP;
Atsumu Hirabayashi, Kodaira, JP;
Yasushi Terui, Tsuchiura, JP;
Toshiyuki Yokosuka, Hitachi, JP;
Kinya Kobayashi, Hitachi, JP;
Kiyomi Yoshinari, Hitachi, JP;
Atsushi Otake, Hitachiohta, JP;
Atsumu Hirabayashi, Kodaira, JP;
Yasushi Terui, Tsuchiura, JP;
Hitachi High-Technologies Corp., Tokyo, JP;
Abstract
The present invention can provide a mass spectrometric system judging whether a measurement target is a substance required by an operator within an actual measurement time, when a substance (particularly such as protein or sugar chains) is analyzed. In the mass spectrometric system using a tandem mass spectrometer, a particular substance obtained by separating a sample is ionized, and mass analysis of the ionized substance is performed to obtain a spectrum. This spectrum is compared with a particular spectrum stored in advance, to thereby determine whether both the spectra match with each other. When a match is determined, a particular ion is further ionized within a particular time for detailed analysis. The invention also provides a mass spectrometric method, a diagnosis system and an inspection system each using the mass spectrometric system, and a program for operating a computer to control those systems with desired functions.