The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Dec. 12, 2005
Kazuhiro Hasegawa, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Hideaki Endo, Tokyo, JP;
Ryuichi Hirano, Tokyo, JP;
Atsuhiro Tsuchiya, Tokyo, JP;
Kenichi Koyama, Tokyo, JP;
Katsuyoshi Yamaguchi, Tokyo, JP;
Kazuhiro Hasegawa, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Hideaki Endo, Tokyo, JP;
Ryuichi Hirano, Tokyo, JP;
Atsuhiro Tsuchiya, Tokyo, JP;
Kenichi Koyama, Tokyo, JP;
Katsuyoshi Yamaguchi, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An observation apparatus includes a sample tray that holds a container housing a cultured cell and a culture medium and covered with a lid; an observation unit that serves for observation of the cultured cell; and a shifting unit that relatively shifts the sample tray and a light axis of the observation unit along a plane that is orthogonal to the light axis of the observation unit, wherein the sample tray includes a container holding unit that holds the container by utilizing an elastic force, and at least one of the lid and one portion of the lid is made detachable, with the container being held in the sample tray by the container holding unit.