The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
Feb. 24, 2006
Ian S. Dees, Aloha, OR (US);
Lynne A. Fitzsimmons, Portland, OR (US);
Ian S. Dees, Aloha, OR (US);
Lynne A. Fitzsimmons, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method of attaching measurement data to an area map on the display of a test instrument includes importing a map for display covering a desired spatial region. Appropriate points of interest are overlaid on the map. A user selects measurement data to be attached to the map and, upon selection such as by 'tapping' a touch sensitive screen, a measurement icon is positioned on the map where the selected measurement data was acquired. A thumbnail of the selected measurement data is overlaid on the measurement icon to show both the type of measurement and actual measurement results. Also indicia of quality/strength for the measured signal may be tagged to the measurement icon, such as by changing the color of the border of the measurement icon accordingly. A direction arrow may also be associated with the measurement icon to indicate an orientation of the test instrument when the measurement data was selected.