The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Oct. 06, 2006
Applicants:

Chang Ho Lee, Seoul, KR;

Sun Hwan Kong, Hwaseong-si, KR;

Inventors:

Chang Ho Lee, Seoul, KR;

Sun Hwan Kong, Hwaseong-si, KR;

Assignee:

Samsung Corning Co., Ltd., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/12 (2006.01); H01L 31/256 (2006.01);
U.S. Cl.
CPC ...
Abstract

A gallium nitride thin film on sapphire substrate having reduced bending deformation and a method for manufacturing the same. An etching trench structure is formed on a sapphire substrate by primary nitradation and HCl treatment and a gallium nitride film is grown thereon by secondary nitradation. The gallium nitride thin film on sapphire substrate comprises an etching trench structure formed on a sapphire substrate, wherein a function graph of a curvature radius Y according to a thickness X of a gallium nitride film satisfies Equation 1 below, and corresponds to or is located above a function graph drawn when Yis 6.23±1.15, A is 70.04 ±1.92, and T is 1.59±0.12:,  [Equation 1]


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