The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
May. 15, 2006
Erik Volkerink, San Jose, CA (US);
Hugh S. C. Wallace, Fort Collins, CO (US);
Klaus-dieter Hilliges, Shanghai, CN;
Ajay Khoche, San Jose, CA (US);
Jochen Rivoir, Magstadt, DE;
Erik Volkerink, San Jose, CA (US);
Hugh S. C. Wallace, Fort Collins, CO (US);
Klaus-Dieter Hilliges, Shanghai, CN;
Ajay Khoche, San Jose, CA (US);
Jochen Rivoir, Magstadt, DE;
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
An adaptive test system includes one or more reconfigurable test boards, with each test board including at least one re-configurable test processor. The re-configurable test processors can transmit communicate with one another using an inter-processor communications controller associated with each re-configurable test processor. The communications include configuration information, control information, communication protocols, stimulus data, and responses. Configuration information and stimulus data can also be read from a memory. Configuration information is used to configure one or more re-configurable test processors. Once configured, the re-configurable test processor or processors process the data in order to generate one or more test signals. The one or more test signals are then used to test a DUT.