The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

May. 03, 2005
Applicant:

Phillip R. Gibbs, Atlanta, GA (US);

Inventor:

Phillip R. Gibbs, Atlanta, GA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method, circuit and system for phase-sensitive detection and recovery of complex signals of interest using a double reference lock-in detector. A double reference lock-in detector may have two or more reference signal sources whose signals are first combined, producing a composite (e.g., inter-modulation) reference signal. This signal is then mixed with an input signal, yielding the desired selectivity at the frequency(ies) of interest. A second embodiment uses external reference signals, synchronizing internal references to these before combining the reference signals. Such detectors may used in chiral detection systems for recovering predetermined signals of interest associated with chiral properties of a sample being tested.


Find Patent Forward Citations

Loading…