The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Sep. 07, 2007
Bradley P. Smith, Austin, TX (US);
Bradley P. Smith, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A test circuit tests a device under test (DUT) uses a first switching device and a second switching device. The device under test (DUT) has a terminal for receiving a test signal. The first switching device has an output terminal for use in coupling the test signal to the terminal of the DUT when the DUT is being tested. The first switching device is high impedance when the DUT is not being tested. The second switching device is high impedance when the DUT is being tested and couples a bias control signal to the output terminal of the first switching device when the DUT is not being tested. The bias control signal substantially tracks the test signal. Leakage from the first switching device when other DUTs are being tested is greatly reduced because the bias control signal results in little or no bias across the first switching device.