The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Oct. 04, 2006
Applicants:

Naoyuki Goto, Sagamihara, JP;

Toshitaka Yagi, Sagamihara, JP;

Takayuki Kishi, Sagamihara, JP;

Inventors:

Naoyuki Goto, Sagamihara, JP;

Toshitaka Yagi, Sagamihara, JP;

Takayuki Kishi, Sagamihara, JP;

Assignee:

Ohara Inc., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03C 10/04 (2006.01); G11B 7/241 (2006.01); C03C 10/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an inorganic composition for use in information recording medium disc substrate and such, having an excellent surface property capable of sufficiently corresponding with a ramp load system for high density recording, a high degree of tolerability to high speed rotation, and high productivity at a low melting point. Specifically, this invention provides an inorganic composition containing one crystalline phase selected from the group consisting of α-quartz (α-SiO), lithium disilicate (LiSiO) and lithium monosilicate (LiSiO), or that contain at least a crystalline phase of lithium monosilicate (Li2SiO3), in which a mean particle diameter of a particle showing a crystalline phase contained in the inorganic composition is 1 μm or less, a ring flexural strength is 300 MPa or more, and a surface roughness (an arithmetic mean roughness) thereof after a polishing process is 10 Å or less.


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