The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Feb. 14, 2008
Applicant:
Ryoichi Kinoshita, Chiba, JP;
Inventor:
Ryoichi Kinoshita, Chiba, JP;
Assignee:
SII NanoTechnology Inc., Chiba, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G01K 7/00 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoirto a sensor plateand, at the same time, a two-dimension heat flow passage to a sample holderis ensured.
Kinoshita, Ryoichi. (2009). Heat flow flux type differential scanning calorimeter (U.S. Patent No. 7588366). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7588366
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile