The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Nov. 14, 2006
Edhi Sutjahjo, Cupertino, CA (US);
Kishore Singhal, Milpitas, CA (US);
Byungwook Kim, Los Altos Hills, CA (US);
Goetz Leonhardt, San Jose, CA (US);
Beifang Qiu, Sunnyvale, CA (US);
Sergey Krasnovsky, Portland, OR (US);
Baribrata Biswas, San Jose, CA (US);
Alex Gyure, San Jose, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Edhi Sutjahjo, Cupertino, CA (US);
Kishore Singhal, Milpitas, CA (US);
Byungwook Kim, Los Altos Hills, CA (US);
Goetz Leonhardt, San Jose, CA (US);
Beifang Qiu, Sunnyvale, CA (US);
Sergey Krasnovsky, Portland, OR (US);
Baribrata Biswas, San Jose, CA (US);
Alex Gyure, San Jose, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.