The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
May. 09, 2007
Chih-chien Chang, Yilan County, TW;
Keng-chia Yang, Hsin-Chu, TW;
Yi-sheng Huang, Taipei County, TW;
Ben Shin, Hsinchu, TW;
Chih-Chien Chang, Yilan County, TW;
Keng-Chia Yang, Hsin-Chu, TW;
Yi-Sheng Huang, Taipei County, TW;
Ben Shin, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;
Abstract
A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.